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Symposium "Patent litigation in Japan and Germany" held in Munich, Germany

October 2, 2014, a symposium on "patent litigation in Japan and Germany" was held at the German Patent Office in Munich, Germany. This symposium was cosponsored by JIPA, the German-Japanese Association of Lawyers, the German Patent and Trademark Office, the Japan Patent Attorneys Association, and AIPPI. Mr. Ryuichi Shitara, Chief Judge of the Intellectual Property High Court, Mr. Toshiaki Iimura, ex-Chief Judge of the Intellectual Property High Court, Mr. Ryouichi Mimura, lawyer, Mr. Eiji Katayama, lawyer, Mr. Katsuya Tamai, professor of the Tokyo University, and others from the Japan side, and Mr. Peter Meyer Beck, judge of the Federal Supreme Court, Mr. Klaus Grabinski, judge of the Federal Supreme Court, and others from the German side participated. Mr. Takeshi Ueno, ex-President, participated from JIPA and gave a speech.

The main contents of the speeches included an overview of the patent litigation systems of Japan and Germany, enforcement of method claims in Japan and Germany, enforcement of standard essential patents, and introduction of recent important courts' decisions in Japan and Germany. Lively discussions were made along with questions from moderators and from the audience.

The symposium was successfully held with an audience of more than 300 people. The next meeting will be held in Japan in two years.

[Update 2014-11-18 ]