「知財管理」誌
「知財管理」誌 検索
| 掲載巻(発行年) / 号 / 頁 | 6巻(2006年) / 2号 / 38頁 |
| 論文区分 | 論説 |
| 論文名 | Accelerated Examination/Appeal Examination of Patent Applications |
| 著者 | 特許第1委員会 |
| 抄録 | Among the systems that can be used for effective acquisition of patents, which were mentioned in the September 2005 issue of this journal (Journal of JIPA, Vol.6, No.1, p.42 (2006)), the accelerated examination and accelerated appeal examination systems are particularly familiar systems for users (see “CHIZAI KANRI” (Intellectual Property Management), Vol. 55, No. 10, pp. 1463-1471 (2005)). This article introduces the key points of practices related to the accelerated examination and accelerated appeal examination systems from the viewpoint of increasing the convenience for users. |
